15 results
Using State-and-Transition Modeling to Account for Imperfect Detection in Invasive Species Management
- Leonardo Frid, Tracy Holcombe, Jeffrey T. Morisette, Aaryn D. Olsson, Lindy Brigham, Travis M. Bean, Julio L. Betancourt, Katherine Bryan
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- Journal:
- Invasive Plant Science and Management / Volume 6 / Issue 1 / March 2013
- Published online by Cambridge University Press:
- 20 January 2017, pp. 36-47
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Buffelgrass, a highly competitive and flammable African bunchgrass, is spreading rapidly across both urban and natural areas in the Sonoran Desert of southern and central Arizona. Damages include increased fire risk, losses in biodiversity, and diminished revenues and quality of life. Feasibility of sustained and successful mitigation will depend heavily on rates of spread, treatment capacity, and cost–benefit analysis. We created a decision support model for the wildland–urban interface north of Tucson, AZ, using a spatial state-and-transition simulation modeling framework, the Tool for Exploratory Landscape Scenario Analyses. We addressed the issues of undetected invasions, identifying potentially suitable habitat and calibrating spread rates, while answering questions about how to allocate resources among inventory, treatment, and maintenance. Inputs to the model include a state-and-transition simulation model to describe the succession and control of buffelgrass, a habitat suitability model, management planning zones, spread vectors, estimated dispersal kernels for buffelgrass, and maps of current distribution. Our spatial simulations showed that without treatment, buffelgrass infestations that started with as little as 80 ha (198 ac) could grow to more than 6,000 ha by the year 2060. In contrast, applying unlimited management resources could limit 2060 infestation levels to approximately 50 ha. The application of sufficient resources toward inventory is important because undetected patches of buffelgrass will tend to grow exponentially. In our simulations, areas affected by buffelgrass may increase substantially over the next 50 yr, but a large, upfront investment in buffelgrass control could reduce the infested area and overall management costs.
Influence of Plant Height and Glyphosate on Saflufenacil Efficacy on Glyphosate-Resistant Horseweed (Conyza canadensis)
- Tracy G. Mellendorf, Julie M. Young, Joseph L. Matthews, Bryan G. Young
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- Journal:
- Weed Technology / Volume 27 / Issue 3 / September 2013
- Published online by Cambridge University Press:
- 20 January 2017, pp. 463-467
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A field study was conducted in 2007 and 2008 near Murphysboro, IL to determine the effect of plant height and addition of glyphosate on control of glyphosate-resistant horseweed with saflufenacil. Saflufenacil was applied at rates ranging from 25 to 125 g ai ha−1 alone and in combination with glyphosate at 840 g ae ha−1, and the efficacy compared to paraquat at 840 g ai ha−1. Control of horseweed with glyphosate applied alone was less than 30%, confirming the presence of glyphosate-resistant plants. At 14 d after application, all treatments with saflufenacil or paraquat provided at least 90% control. Saflufenacil applied alone at the lowest rate of 25 g ha−1 provided less control (92%) than all other treatments that included saflufenacil, and efficacy was reduced as horseweed height at application increased. Horseweed control from saflufenacil at 50 g ha−1 was reduced as plant height increased in 2007 but not in 2008. However, saflufenacil applied at 50 g ha−1 or greater resulted in at least 98% control, regardless of horseweed height at application or tank mixture with glyphosate. Combining glyphosate with saflufenacil at 25 g ha−1 increased horseweed control compared with saflufenacil applied alone and resulted in control similar to saflufenacil applied at 50 g ha−1. Control of horseweed from paraquat declined over time as the growth continued from the apical meristem. The extent of horseweed regrowth from applications of saflufenacil alone was less than that observed from paraquat. The addition of glyphosate to saflufenacil further reduced the frequency of horseweed regrowth compared with saflufenacil applied alone.
Influence of Application Variables on the Foliar Efficacy of Saflufenacil on Horseweed (Conyza canadensis)
- Tracy G. Mellendorf, Julie M. Young, Joseph L. Matthews, Bryan G. Young
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- Journal:
- Weed Science / Volume 63 / Issue 3 / September 2015
- Published online by Cambridge University Press:
- 20 January 2017, pp. 578-586
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Greenhouse studies were conducted to determine the influence of spray-solution pH, adjuvant, light intensity, temperature, and glyphosate on the efficacy of saflufenacil on horseweed. Control of glyphosate-resistant horseweed from saflufenacil alone was greatest with a spray-solution pH of 5, compared with pH 7 or 9. However, when glyphosate was added to saflufenacil, similar GR50 values were measured with spray solutions adjusted to pH 5 and 9, and horseweed control at pH 9 was 38% greater than at pH 7. The efficacy of saflufenacil on horseweed was 36% greater when crop oil concentrate was used as an adjuvant compared with nonionic surfactant, regardless of the addition of glyphosate or the sensitivity of the horseweed population to glyphosate (resistant vs. susceptible). The addition of glyphosate to low rates of saflufenacil increased control over saflufenacil applied alone on glyphosate-susceptible and -resistant horseweed. Saflufenacil activity was greater under low light intensity (300 μmol m−2 s−1) than high light intensity (1,000 μmol m−2 s−1). Although initial horseweed control was greater under high temperature (27 C) compared with low temperature (10 C), by 21 d after treatment horseweed dry weight was similar from saflufenacil applied under high and low temperatures.
Contributors
- Edited by James Farr, Northwestern University, Illinois, David Lay Williams, DePaul University, Chicago
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- Book:
- The General Will
- Published online:
- 05 February 2015
- Print publication:
- 16 February 2015, pp vii-x
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- By Rose Teteki Abbey, K. C. Abraham, David Tuesday Adamo, LeRoy H. Aden, Efrain Agosto, Victor Aguilan, Gillian T. W. Ahlgren, Charanjit Kaur AjitSingh, Dorothy B E A Akoto, Giuseppe Alberigo, Daniel E. Albrecht, Ruth Albrecht, Daniel O. Aleshire, Urs Altermatt, Anand Amaladass, Michael Amaladoss, James N. Amanze, Lesley G. Anderson, Thomas C. Anderson, Victor Anderson, Hope S. Antone, María Pilar Aquino, Paula Arai, Victorio Araya Guillén, S. Wesley Ariarajah, Ellen T. Armour, Brett Gregory Armstrong, Atsuhiro Asano, Naim Stifan Ateek, Mahmoud Ayoub, John Alembillah Azumah, Mercedes L. García Bachmann, Irena Backus, J. Wayne Baker, Mieke Bal, Lewis V. Baldwin, William Barbieri, António Barbosa da Silva, David Basinger, Bolaji Olukemi Bateye, Oswald Bayer, Daniel H. Bays, Rosalie Beck, Nancy Elizabeth Bedford, Guy-Thomas Bedouelle, Chorbishop Seely Beggiani, Wolfgang Behringer, Christopher M. Bellitto, Byard Bennett, Harold V. Bennett, Teresa Berger, Miguel A. Bernad, Henley Bernard, Alan E. Bernstein, Jon L. Berquist, Johannes Beutler, Ana María Bidegain, Matthew P. Binkewicz, Jennifer Bird, Joseph Blenkinsopp, Dmytro Bondarenko, Paulo Bonfatti, Riet en Pim Bons-Storm, Jessica A. Boon, Marcus J. Borg, Mark Bosco, Peter C. Bouteneff, François Bovon, William D. Bowman, Paul S. Boyer, David Brakke, Richard E. Brantley, Marcus Braybrooke, Ian Breward, Ênio José da Costa Brito, Jewel Spears Brooker, Johannes Brosseder, Nicholas Canfield Read Brown, Robert F. Brown, Pamela K. Brubaker, Walter Brueggemann, Bishop Colin O. Buchanan, Stanley M. Burgess, Amy Nelson Burnett, J. Patout Burns, David B. Burrell, David Buttrick, James P. Byrd, Lavinia Byrne, Gerado Caetano, Marcos Caldas, Alkiviadis Calivas, William J. Callahan, Salvatore Calomino, Euan K. Cameron, William S. Campbell, Marcelo Ayres Camurça, Daniel F. Caner, Paul E. Capetz, Carlos F. Cardoza-Orlandi, Patrick W. Carey, Barbara Carvill, Hal Cauthron, Subhadra Mitra Channa, Mark D. Chapman, James H. Charlesworth, Kenneth R. Chase, Chen Zemin, Luciano Chianeque, Philip Chia Phin Yin, Francisca H. Chimhanda, Daniel Chiquete, John T. Chirban, Soobin Choi, Robert Choquette, Mita Choudhury, Gerald Christianson, John Chryssavgis, Sejong Chun, Esther Chung-Kim, Charles M. A. Clark, Elizabeth A. Clark, Sathianathan Clarke, Fred Cloud, John B. Cobb, W. Owen Cole, John A Coleman, John J. Collins, Sylvia Collins-Mayo, Paul K. Conkin, Beth A. Conklin, Sean Connolly, Demetrios J. Constantelos, Michael A. Conway, Paula M. Cooey, Austin Cooper, Michael L. Cooper-White, Pamela Cooper-White, L. William Countryman, Sérgio Coutinho, Pamela Couture, Shannon Craigo-Snell, James L. Crenshaw, David Crowner, Humberto Horacio Cucchetti, Lawrence S. Cunningham, Elizabeth Mason Currier, Emmanuel Cutrone, Mary L. Daniel, David D. Daniels, Robert Darden, Rolf Darge, Isaiah Dau, Jeffry C. Davis, Jane Dawson, Valentin Dedji, John W. de Gruchy, Paul DeHart, Wendy J. Deichmann Edwards, Miguel A. De La Torre, George E. Demacopoulos, Thomas de Mayo, Leah DeVun, Beatriz de Vasconcellos Dias, Dennis C. Dickerson, John M. Dillon, Luis Miguel Donatello, Igor Dorfmann-Lazarev, Susanna Drake, Jonathan A. Draper, N. Dreher Martin, Otto Dreydoppel, Angelyn Dries, A. J. Droge, Francis X. D'Sa, Marilyn Dunn, Nicole Wilkinson Duran, Rifaat Ebied, Mark J. Edwards, William H. Edwards, Leonard H. Ehrlich, Nancy L. Eiesland, Martin Elbel, J. Harold Ellens, Stephen Ellingson, Marvin M. Ellison, Robert Ellsberg, Jean Bethke Elshtain, Eldon Jay Epp, Peter C. Erb, Tassilo Erhardt, Maria Erling, Noel Leo Erskine, Gillian R. Evans, Virginia Fabella, Michael A. Fahey, Edward Farley, Margaret A. Farley, Wendy Farley, Robert Fastiggi, Seena Fazel, Duncan S. Ferguson, Helwar Figueroa, Paul Corby Finney, Kyriaki Karidoyanes FitzGerald, Thomas E. FitzGerald, John R. Fitzmier, Marie Therese Flanagan, Sabina Flanagan, Claude Flipo, Ronald B. Flowers, Carole Fontaine, David Ford, Mary Ford, Stephanie A. Ford, Jim Forest, William Franke, Robert M. Franklin, Ruth Franzén, Edward H. Friedman, Samuel Frouisou, Lorelei F. Fuchs, Jojo M. Fung, Inger Furseth, Richard R. Gaillardetz, Brandon Gallaher, China Galland, Mark Galli, Ismael García, Tharscisse Gatwa, Jean-Marie Gaudeul, Luis María Gavilanes del Castillo, Pavel L. Gavrilyuk, Volney P. Gay, Metropolitan Athanasios Geevargis, Kondothra M. George, Mary Gerhart, Simon Gikandi, Maurice Gilbert, Michael J. Gillgannon, Verónica Giménez Beliveau, Terryl Givens, Beth Glazier-McDonald, Philip Gleason, Menghun Goh, Brian Golding, Bishop Hilario M. Gomez, Michelle A. Gonzalez, Donald K. Gorrell, Roy Gottfried, Tamara Grdzelidze, Joel B. Green, Niels Henrik Gregersen, Cristina Grenholm, Herbert Griffiths, Eric W. Gritsch, Erich S. Gruen, Christoffer H. Grundmann, Paul H. Gundani, Jon P. Gunnemann, Petre Guran, Vidar L. Haanes, Jeremiah M. Hackett, Getatchew Haile, Douglas John Hall, Nicholas Hammond, Daphne Hampson, Jehu J. Hanciles, Barry Hankins, Jennifer Haraguchi, Stanley S. Harakas, Anthony John Harding, Conrad L. Harkins, J. William Harmless, Marjory Harper, Amir Harrak, Joel F. Harrington, Mark W. Harris, Susan Ashbrook Harvey, Van A. Harvey, R. Chris Hassel, Jione Havea, Daniel Hawk, Diana L. Hayes, Leslie Hayes, Priscilla Hayner, S. Mark Heim, Simo Heininen, Richard P. Heitzenrater, Eila Helander, David Hempton, Scott H. Hendrix, Jan-Olav Henriksen, Gina Hens-Piazza, Carter Heyward, Nicholas J. Higham, David Hilliard, Norman A. Hjelm, Peter C. Hodgson, Arthur Holder, M. Jan Holton, Dwight N. Hopkins, Ronnie Po-chia Hsia, Po-Ho Huang, James Hudnut-Beumler, Jennifer S. Hughes, Leonard M. Hummel, Mary E. Hunt, Laennec Hurbon, Mark Hutchinson, Susan E. Hylen, Mary Beth Ingham, H. Larry Ingle, Dale T. Irvin, Jon Isaak, Paul John Isaak, Ada María Isasi-Díaz, Hans Raun Iversen, Margaret C. Jacob, Arthur James, Maria Jansdotter-Samuelsson, David Jasper, Werner G. Jeanrond, Renée Jeffery, David Lyle Jeffrey, Theodore W. Jennings, David H. Jensen, Robin Margaret Jensen, David Jobling, Dale A. Johnson, Elizabeth A. Johnson, Maxwell E. Johnson, Sarah Johnson, Mark D. Johnston, F. Stanley Jones, James William Jones, John R. Jones, Alissa Jones Nelson, Inge Jonsson, Jan Joosten, Elizabeth Judd, Mulambya Peggy Kabonde, Robert Kaggwa, Sylvester Kahakwa, Isaac Kalimi, Ogbu U. Kalu, Eunice Kamaara, Wayne C. Kannaday, Musimbi Kanyoro, Veli-Matti Kärkkäinen, Frank Kaufmann, Léon Nguapitshi Kayongo, Richard Kearney, Alice A. Keefe, Ralph Keen, Catherine Keller, Anthony J. Kelly, Karen Kennelly, Kathi Lynn Kern, Fergus Kerr, Edward Kessler, George Kilcourse, Heup Young Kim, Kim Sung-Hae, Kim Yong-Bock, Kim Yung Suk, Richard King, Thomas M. King, Robert M. Kingdon, Ross Kinsler, Hans G. Kippenberg, Cheryl A. Kirk-Duggan, Clifton Kirkpatrick, Leonid Kishkovsky, Nadieszda Kizenko, Jeffrey Klaiber, Hans-Josef Klauck, Sidney Knight, Samuel Kobia, Robert Kolb, Karla Ann Koll, Heikki Kotila, Donald Kraybill, Philip D. W. Krey, Yves Krumenacker, Jeffrey Kah-Jin Kuan, Simanga R. Kumalo, Peter Kuzmic, Simon Shui-Man Kwan, Kwok Pui-lan, André LaCocque, Stephen E. Lahey, John Tsz Pang Lai, Emiel Lamberts, Armando Lampe, Craig Lampe, Beverly J. Lanzetta, Eve LaPlante, Lizette Larson-Miller, Ariel Bybee Laughton, Leonard Lawlor, Bentley Layton, Robin A. Leaver, Karen Lebacqz, Archie Chi Chung Lee, Marilyn J. Legge, Hervé LeGrand, D. L. LeMahieu, Raymond Lemieux, Bill J. Leonard, Ellen M. Leonard, Outi Leppä, Jean Lesaulnier, Nantawan Boonprasat Lewis, Henrietta Leyser, Alexei Lidov, Bernard Lightman, Paul Chang-Ha Lim, Carter Lindberg, Mark R. Lindsay, James R. Linville, James C. Livingston, Ann Loades, David Loades, Jean-Claude Loba-Mkole, Lo Lung Kwong, Wati Longchar, Eleazar López, David W. Lotz, Andrew Louth, Robin W. Lovin, William Luis, Frank D. Macchia, Diarmaid N. J. MacCulloch, Kirk R. MacGregor, Marjory A. MacLean, Donald MacLeod, Tomas S. Maddela, Inge Mager, Laurenti Magesa, David G. Maillu, Fortunato Mallimaci, Philip Mamalakis, Kä Mana, Ukachukwu Chris Manus, Herbert Robinson Marbury, Reuel Norman Marigza, Jacqueline Mariña, Antti Marjanen, Luiz C. L. Marques, Madipoane Masenya (ngwan'a Mphahlele), Caleb J. D. Maskell, Steve Mason, Thomas Massaro, Fernando Matamoros Ponce, András Máté-Tóth, Odair Pedroso Mateus, Dinis Matsolo, Fumitaka Matsuoka, John D'Arcy May, Yelena Mazour-Matusevich, Theodore Mbazumutima, John S. McClure, Christian McConnell, Lee Martin McDonald, Gary B. McGee, Thomas McGowan, Alister E. McGrath, Richard J. McGregor, John A. McGuckin, Maud Burnett McInerney, Elsie Anne McKee, Mary B. McKinley, James F. McMillan, Ernan McMullin, Kathleen E. McVey, M. Douglas Meeks, Monica Jyotsna Melanchthon, Ilie Melniciuc-Puica, Everett Mendoza, Raymond A. Mentzer, William W. Menzies, Ina Merdjanova, Franziska Metzger, Constant J. Mews, Marvin Meyer, Carol Meyers, Vasile Mihoc, Gunner Bjerg Mikkelsen, Maria Inêz de Castro Millen, Clyde Lee Miller, Bonnie J. Miller-McLemore, Alexander Mirkovic, Paul Misner, Nozomu Miyahira, R. W. L. Moberly, Gerald Moede, Aloo Osotsi Mojola, Sunanda Mongia, Rebeca Montemayor, James Moore, Roger E. Moore, Craig E. Morrison O.Carm, Jeffry H. Morrison, Keith Morrison, Wilson J. Moses, Tefetso Henry Mothibe, Mokgethi Motlhabi, Fulata Moyo, Henry Mugabe, Jesse Ndwiga Kanyua Mugambi, Peggy Mulambya-Kabonde, Robert Bruce Mullin, Pamela Mullins Reaves, Saskia Murk Jansen, Heleen L. Murre-Van den Berg, Augustine Musopole, Isaac M. T. Mwase, Philomena Mwaura, Cecilia Nahnfeldt, Anne Nasimiyu Wasike, Carmiña Navia Velasco, Thulani Ndlazi, Alexander Negrov, James B. Nelson, David G. Newcombe, Carol Newsom, Helen J. Nicholson, George W. E. Nickelsburg, Tatyana Nikolskaya, Damayanthi M. A. Niles, Bertil Nilsson, Nyambura Njoroge, Fidelis Nkomazana, Mary Beth Norton, Christian Nottmeier, Sonene Nyawo, Anthère Nzabatsinda, Edward T. Oakes, Gerald O'Collins, Daniel O'Connell, David W. Odell-Scott, Mercy Amba Oduyoye, Kathleen O'Grady, Oyeronke Olajubu, Thomas O'Loughlin, Dennis T. Olson, J. Steven O'Malley, Cephas N. Omenyo, Muriel Orevillo-Montenegro, César Augusto Ornellas Ramos, Agbonkhianmeghe E. Orobator, Kenan B. Osborne, Carolyn Osiek, Javier Otaola Montagne, Douglas F. Ottati, Anna May Say Pa, Irina Paert, Jerry G. Pankhurst, Aristotle Papanikolaou, Samuele F. Pardini, Stefano Parenti, Peter Paris, Sung Bae Park, Cristián G. Parker, Raquel Pastor, Joseph Pathrapankal, Daniel Patte, W. Brown Patterson, Clive Pearson, Keith F. Pecklers, Nancy Cardoso Pereira, David Horace Perkins, Pheme Perkins, Edward N. Peters, Rebecca Todd Peters, Bishop Yeznik Petrossian, Raymond Pfister, Peter C. Phan, Isabel Apawo Phiri, William S. F. Pickering, Derrick G. Pitard, William Elvis Plata, Zlatko Plese, John Plummer, James Newton Poling, Ronald Popivchak, Andrew Porter, Ute Possekel, James M. Powell, Enos Das Pradhan, Devadasan Premnath, Jaime Adrían Prieto Valladares, Anne Primavesi, Randall Prior, María Alicia Puente Lutteroth, Eduardo Guzmão Quadros, Albert Rabil, Laurent William Ramambason, Apolonio M. Ranche, Vololona Randriamanantena Andriamitandrina, Lawrence R. Rast, Paul L. Redditt, Adele Reinhartz, Rolf Rendtorff, Pål Repstad, James N. Rhodes, John K. Riches, Joerg Rieger, Sharon H. Ringe, Sandra Rios, Tyler Roberts, David M. Robinson, James M. Robinson, Joanne Maguire Robinson, Richard A. H. Robinson, Roy R. Robson, Jack B. Rogers, Maria Roginska, Sidney Rooy, Rev. Garnett Roper, Maria José Fontelas Rosado-Nunes, Andrew C. Ross, Stefan Rossbach, François Rossier, John D. Roth, John K. Roth, Phillip Rothwell, Richard E. Rubenstein, Rosemary Radford Ruether, Markku Ruotsila, John E. Rybolt, Risto Saarinen, John Saillant, Juan Sanchez, Wagner Lopes Sanchez, Hugo N. Santos, Gerhard Sauter, Gloria L. Schaab, Sandra M. Schneiders, Quentin J. Schultze, Fernando F. Segovia, Turid Karlsen Seim, Carsten Selch Jensen, Alan P. F. Sell, Frank C. Senn, Kent Davis Sensenig, Damían Setton, Bal Krishna Sharma, Carolyn J. Sharp, Thomas Sheehan, N. Gerald Shenk, Christian Sheppard, Charles Sherlock, Tabona Shoko, Walter B. Shurden, Marguerite Shuster, B. Mark Sietsema, Batara Sihombing, Neil Silberman, Clodomiro Siller, Samuel Silva-Gotay, Heikki Silvet, John K. Simmons, Hagith Sivan, James C. Skedros, Abraham Smith, Ashley A. Smith, Ted A. Smith, Daud Soesilo, Pia Søltoft, Choan-Seng (C. S.) Song, Kathryn Spink, Bryan Spinks, Eric O. Springsted, Nicolas Standaert, Brian Stanley, Glen H. Stassen, Karel Steenbrink, Stephen J. Stein, Andrea Sterk, Gregory E. Sterling, Columba Stewart, Jacques Stewart, Robert B. Stewart, Cynthia Stokes Brown, Ken Stone, Anne Stott, Elizabeth Stuart, Monya Stubbs, Marjorie Hewitt Suchocki, David Kwang-sun Suh, Scott W. Sunquist, Keith Suter, Douglas Sweeney, Charles H. Talbert, Shawqi N. Talia, Elsa Tamez, Joseph B. Tamney, Jonathan Y. Tan, Yak-Hwee Tan, Kathryn Tanner, Feiya Tao, Elizabeth S. Tapia, Aquiline Tarimo, Claire Taylor, Mark Lewis Taylor, Bishop Abba Samuel Wolde Tekestebirhan, Eugene TeSelle, M. Thomas Thangaraj, David R. Thomas, Andrew Thornley, Scott Thumma, Marcelo Timotheo da Costa, George E. “Tink” Tinker, Ola Tjørhom, Karen Jo Torjesen, Iain R. Torrance, Fernando Torres-Londoño, Archbishop Demetrios [Trakatellis], Marit Trelstad, Christine Trevett, Phyllis Trible, Johannes Tromp, Paul Turner, Robert G. Tuttle, Archbishop Desmond Tutu, Peter Tyler, Anders Tyrberg, Justin Ukpong, Javier Ulloa, Camillus Umoh, Kristi Upson-Saia, Martina Urban, Monica Uribe, Elochukwu Eugene Uzukwu, Richard Vaggione, Gabriel Vahanian, Paul Valliere, T. J. Van Bavel, Steven Vanderputten, Peter Van der Veer, Huub Van de Sandt, Louis Van Tongeren, Luke A. Veronis, Noel Villalba, Ramón Vinke, Tim Vivian, David Voas, Elena Volkova, Katharina von Kellenbach, Elina Vuola, Timothy Wadkins, Elaine M. Wainwright, Randi Jones Walker, Dewey D. Wallace, Jerry Walls, Michael J. Walsh, Philip Walters, Janet Walton, Jonathan L. Walton, Wang Xiaochao, Patricia A. Ward, David Harrington Watt, Herold D. Weiss, Laurence L. Welborn, Sharon D. Welch, Timothy Wengert, Traci C. West, Merold Westphal, David Wetherell, Barbara Wheeler, Carolinne White, Jean-Paul Wiest, Frans Wijsen, Terry L. Wilder, Felix Wilfred, Rebecca Wilkin, Daniel H. Williams, D. Newell Williams, Michael A. Williams, Vincent L. Wimbush, Gabriele Winkler, Anders Winroth, Lauri Emílio Wirth, James A. Wiseman, Ebba Witt-Brattström, Teofil Wojciechowski, John Wolffe, Kenman L. Wong, Wong Wai Ching, Linda Woodhead, Wendy M. Wright, Rose Wu, Keith E. Yandell, Gale A. Yee, Viktor Yelensky, Yeo Khiok-Khng, Gustav K. K. Yeung, Angela Yiu, Amos Yong, Yong Ting Jin, You Bin, Youhanna Nessim Youssef, Eliana Yunes, Robert Michael Zaller, Valarie H. Ziegler, Barbara Brown Zikmund, Joyce Ann Zimmerman, Aurora Zlotnik, Zhuo Xinping
- Edited by Daniel Patte, Vanderbilt University, Tennessee
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- Book:
- The Cambridge Dictionary of Christianity
- Published online:
- 05 August 2012
- Print publication:
- 20 September 2010, pp xi-xliv
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Experience with a Dicing Saw for Rapid Pre-FIB TEM Sample Preparation
- Jim Conner, James Beck, Bryan Tracy
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- Journal:
- Microscopy Today / Volume 13 / Issue 2 / March 2005
- Published online by Cambridge University Press:
- 14 March 2018, pp. 26-29
- Print publication:
- March 2005
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Since the publication of the use of a dicing saw for TEM sample preparation, several analytical labs have adopted this method as standard practice for site-specific cross section and plan view samples. In this article, we would like to provide additional practical details of these procedures, and describe several extensions, including useful notes on batch processing, preparing samples with an area of interest very close to the sample edge, and a Focused Ion Beam (FIB)-compatible sample holder. We present an unusual amount of detail in these processes to show some of the evolution of the method since its introduction and to allow others to easily reproduce these results.
The Application of Low Energy Scanning-Transmission Electron Microscopy (LVSTEM) to the Study of Semiconductor Materials and Devices
- Bryan Tracy
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 21 July 2003, pp. 20-21
- Print publication:
- August 2003
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Policy Punctuations in American Political Institutions
- Bryan D. Jones, Tracy Sulkin, Heather A. Larsen
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- Journal:
- American Political Science Review / Volume 97 / Issue 1 / February 2003
- Published online by Cambridge University Press:
- 12 March 2003, pp. 151-169
- Print publication:
- February 2003
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Political institutions translate inputs—in the form of changed preferences, new participants, new information, or sudden attention to previously available information—into policy outputs. In the process they impose costs on this translation, and these costs increase institutional friction. We argue that the “friction” in political institutions leads not to consistent “gridlock” but to long periods of stasis interspersed with dramatic policy punctuations. As political institutions add costs to the translation of inputs into outputs, institutional friction will increase, and outputs from the process will become increasingly punctuated overall. We use a stochastic process approach to compare the extent of punctuations among 15 data sets that assess change in U.S. government budgets, in a variety of aspects of the public policy process, in election results, and in stock market returns in the United States. We find that all of these distributions display positive kurtosis—tall central peaks (representing considerable stability) and heavy tails (reflecting the punctuations, both positive and negative). When we order institutions according to the costs they impose on collective action, those with higher decision and transaction costs generate more positive kurtosis. Direct parameter estimates indicate that all distributions except budget data were best fit by the double-exponential probability distribution; budgets are Paretian.
This project was funded by the Political Science Program of the National Science Foundation, Award SES9904700. We appreciate the support of Frank Scioli, the program officer, and various political science program directors. We benefited from comments by Frank Baumgartner, John Brehm, Chris Mackie, Peter John, John Padgett, Bat Sparrow, Jim True and John Wilkerson.
Measuring The Work Functions Of PVD TaN, TaSiN And TiSiN Films With A Schottky Diode CV Technique For Metal Gate CMOS Applications
- James Pan, Christy Woo, Minh-Van Ngo, Bryan Tracy, Ercan Adem, Stephen Robie, Qi Xiang, Ming-Ren Lin
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- Journal:
- MRS Online Proceedings Library Archive / Volume 745 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, N3.2
- Print publication:
- 2002
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The metal gate process becomes a promising candidate for sub-65nm CMOS, due to the elimination of polysilicon depletion effects, and the possibility of adjusting the CMOS threshold voltage without more threshold implants. Our goal is to process mteal films with tunable work functions, in order to meet the demand of sub-65nm metal gate CMOS.
PVD TaN films are deposited with various processing conditions. Auger analysis shows that by changing the nitrogen flow rate and the plasma power, the nitrogen content in the TaN films can be adjusted. In order to accurately determine the work function of these TaN materials, we have developed a Schottky Diode CV technique (or Metal-Silicon CV, or MS-CV). This approach not only improves the accuracy of the metal work function measurement, compared with the traditional MOS-CV technique (which is affected by the thickness and quality of the oxide), but also simplifies the fabrication.
With the MS-CV's, we have successfully measured the work functions of Ni and Co, and compared the data with published references. The work function of PVD TaN actually decreases with higher nitrogen content, according to the Auger data and the MS-CV measurement, ranging from 3.42 – 4.20 Volts. The MS-CV technique is shown to be independent to the size of the capacitors, and is little affected by the measurement frequency. By changing the frequency from 100KHz to 1MHz, the error in the work function is less than 50mV.
Semiconductor Microscopy - Microscopy at the Instrumental Performance Limit
- Bryan M. Tracy
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 512-513
- Print publication:
- August 2001
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The microscopy to support process development of Si-based semiconductors has consistently required state-of-the-art instrumentation. As the industry strains to achieve 1 OOnm design rules, this requirement has never been more pronounced. This paper presents TEM, SEM and FIB examples with a focus on using the instrumentation near the performance limit.
Transmission Electron Microscopy - The high contrast and high resolution images provided by the TEM have made this “research instrument” into the mainstay of the semiconductor analysis laboratory. For the vast majority of samples, both plan view and cross sections, precious little tilt is required. For cross sections, +/- 3 degrees is usually adequate to bring the silicon into (110) orientation and plan views are commonly made from polycrystalline films, which benefit more from choosing the right thickness than from tilt. Under appreciated is the benefit of very high resolution polepieces which have superior spherical and chromatic aberration coefficients producing real improvements in image quality.
Defect Review at 0.25 Micron Electron Optic Requirements and Practical Examples
- Bryan Tracy
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 447-448
- Print publication:
- August 1997
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The sub-micron era in 1C process technology has been characterized by ever shrinking device geometries. When the minimum feature size of 0.5 micron was reached, a significant inflection in the usefulness of optical microscopy occurred. Seemingly routine Fab activities such as the use of the optical microscopes to determine the quality of the metal etch were no longer possible. At the same time, an increased use of defect inspection tools such as KLA and Tencor was required to insure stable process quality. These and other factors combined to hasten the introduction of multiple defect review scanning electron microscopes into the modern 1C Fab. This trend has accelerated during the process development of 0.25 micron technology. Accordingly, as leading 1C manufactures introduce production 0.25 devices, it is not unusual to find as many as six such instruments installed in a modern development or fabrication facility. As such, these instruments, commonly called Defect Review Tools (DRT's) constitute an increasing share of the Fab equipment set.
13 - Shadows and mirrors: Alternative avenues to the development of self-recognition in chimpanzees
- Edited by Sue Taylor Parker, Sonoma State University, California, Robert W. Mitchell, Eastern Kentucky University, Richmond, Maria L. Boccia
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- Book:
- Self-Awareness in Animals and Humans
- Published online:
- 24 November 2009
- Print publication:
- 27 May 1994, pp 227-240
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Summary
Self-awareness has long been described as a capacity unique to, or perhaps defining, humans (Gallup, 1977b, 1983; Suarez & Gallup, 1981), and has been evaluated in numerous nonhuman species since the innovative studies of Gallup (1970). The ontogeny of self-recognition in human infants, that is, the acquisition of knowledge of one's physical appearance as a component of self-awareness, has also been explored by those with interests in human development, with most studies employing a variant of the Gallup (1970) mark test (Amsterdam, 1972; Bertenthal & Fischer, 1978; Brooks-Gunn & Lewis, 1984; Dixon, 1957; Papoušek & Papoušek, 1974). This test entails a surreptitiously applied mark (rouge placed on the child's nose) and attentional orientation to the mark as the dependent variable as the child views itself in a mirror. Similarly, self-recognition has been evaluated, principally through the use of the mark test, with a number of nonhuman primate species and elephants (see review by Anderson, 1984; Calhoun & Thompson, 1988; Gallup, 1970, 1977a,b, 1983, 1991, SAAH3; Gallup, Wallnau, & Suarez, 1980; Ledbetter & Basen, 1982; Lin, Bard, & Anderson, 1992; Povinelli, 1989; Robert, 1986; Suarez & Gallup, 1981; Swartz & Evans, 1991). Self-recognition, as one facet of self-awareness, has been demonstrated through the mirror mark test in chimpanzees (Gallup, 1970; Lin, Bard, & Anderson, 1992; Suarez & Gallup, 1981), and orangutans (Lethmate & Dücker, 1973), and the gorilla Koko (Patterson & Cohn, SAAH17).
Preparation of Large Thin Area Vlsi Tem Specimens by Dimpling With A “Flatting Tool”
- Helen L. Humiston, Bryan M. Tracy, M. Lawrence, A. Dass
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- Journal:
- MRS Online Proceedings Library Archive / Volume 254 / 1991
- Published online by Cambridge University Press:
- 21 February 2011, 211
- Print publication:
- 1991
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An alternative VLSI TEM specimen preparation technique has been developed to produce 100μm diameter electron transparent thin area by using a conventional dimpler with a texmet padded ‘flatting tool’ for dimpling and a microcloth padded ‘flatting tool’ for polishing, followed by low angle ion milling. The advantages of this technique are a large sampling area and shorter milling times than conventional specimen preparation methods. In the following, we report the details of the modified dimpling technique. The improvements in available electron transparency, and a decrease in ion milling time are demonstrated with the preparation of planar and cross section VLSI device samples.
Identification of W20O58 Phase In CVD Tungsten Films
- M. Lawrence, A. Dass, Siva Sivaram, Bryan Tracy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 168 / 1989
- Published online by Cambridge University Press:
- 21 February 2011, 185
- Print publication:
- 1989
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Thin films of tungsten grown in a CVD reactor by the reduction of hydrogen and silane consisted of a two phase microstructures; a matrix phase of bcc tungsten, and a second phase of W20O58. The second phase is uniformly distributed in the film and does not afeoct 5athe electrical resistivity of hydrogenreduced films (8 μohm-cm). However, dissolved oxygen in the silane-reduced film contributes to the observed higher electrical resistivity (13 μohm-cm) along with smaller grain size. The larger amount of oxide in the hydrogen-reduced film correlates with its slower growth rate when compared to the silane-reduced film which contained a smaller amount of oxide phase.
Titanium-Silicon Interactions During Ion Beam Irradiation
- Bryan M. Tracy, Rama K. Shukla, Paul W. Davies
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- Journal:
- MRS Online Proceedings Library Archive / Volume 74 / 1986
- Published online by Cambridge University Press:
- 28 February 2011, 659
- Print publication:
- 1986
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As* ion beam irradiation of thin titanium (∼300Å) films deposited on silicon substrates at sufficiently high dose and energy has been shown to induce an athermal thin film reaction (as evidenced by insenstivity of the reaction to irradiation current) leading to the formation of a homogeneous titanium subsilicide phase with an extremely smooth interface to the underlying silicon. RBS indicates a stoichiometry of Ti3Si4 for this silicide phase. Subsequent rapid thermal annealing (RTA) of this silicide results in the incorporation of additional silicon leading ultimately to the formation of the stable C-54 TiSi2 phase. Silicided junctions fabricated using a ion beam irradiation show improved sheet resistance uniformity and leakage characteristics when compared with those fabricated using the conventional RTA salicide process.